Toosi T, Sirola M, Laukkanen J, van Heeswijk M, Karhunen J. METHOD FOR DETECTING AGING RELATED FAILURES OF PROCESS SENSORS VIA NOISE SIGNAL MEASUREMENT. IJC [Internet]. 2019Jun.30 [cited 2024May3];18(2):135-46. Available from: https://www.computingonline.net/computing/article/view/1412