Tsague, Hippolyte Djonon, and Bhekisipho Twala. “INVESTIGATION OF CARRIER MOBILITY DEGRADATION EFFECTS ON MOSFET LEAKAGE SIMULATIONS”. International Journal of Computing 15, no. 4 (December 29, 2016): 237-247. Accessed April 19, 2024. https://www.computingonline.net/computing/article/view/855.