TSAGUE, H. D.; TWALA, B. INVESTIGATION OF CARRIER MOBILITY DEGRADATION EFFECTS ON MOSFET LEAKAGE SIMULATIONS. International Journal of Computing, [S. l.], v. 15, n. 4, p. 237-247, 2016. DOI: 10.47839/ijc.15.4.855. Disponível em: https://www.computingonline.net/computing/article/view/855. Acesso em: 3 dec. 2022.